Via coupling within power-return plane structures considering the radiation loss

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2004, Pages 386-391

  Chen, Richard L ^a   Chen, Ji ^a   Hubing, Todd H ^b   Shi, Weimin ^c  

^a UNIVERSITY OF HOUSTON   (United States)

^b University of Missouri Rolla   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTOR LOSSES; RADIATION LOSSES; REFLECTION COEFFICIENTS; SPECTRAL DOMAIN IMMITANCE (SDI);

DIELECTRIC LOSSES; ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE INTERFERENCE; NATURAL FREQUENCIES; PRINTED CIRCUIT BOARDS; SPURIOUS SIGNAL NOISE; SWITCHING;

RADIATION EFFECTS;

EID: 4644337940     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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