Via and return path discontinuity impact on high speed digital signal quality

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2000, Pages 215-218

  Chen, Qinglun ^a   Zhao, Jin ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC IMPEDANCE; TRANSMISSION LINE THEORY;

RETURN PATH DISCONTINUITY;

DIGITAL SIGNAL PROCESSING;

EID: 0034497752     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (2)