How flat is an air-cleaved mica surface?

Nanotechnology

Volumn 19, Issue 30, 2008, Pages

  Ostendorf, F ^a   Schmitz, C ^a   Hirth, S ^a   Kuhnle A ^a   Kolodziej, J J ^b   Reichling, M ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; CHARGED PARTICLES; DEGASSING; FEES AND CHARGES; FINANCE; GARNETS; MICA; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SILICA; SILICATE MINERALS; STANDARDS; SURFACE CHARGE; SURFACES; ULTRAHIGH VACUUM;

AFM IMAGING; ATOMICALLY FLAT SURFACES; DYNAMIC ATOMIC FORCE MICROSCOPY; FLAT SURFACES; HIGH-DENSITY; MICA SURFACES; MUSCOVITE MICA; NANOMETRE; NON CONTACT MODE; ULTRA-HIGH VACUUM (UHV);

IMAGING TECHNIQUES;

MICA; POTASSIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRIC POTENTIAL; ELECTRICITY; MORPHOLOGY; PRIORITY JOURNAL; STRUCTURE ANALYSIS; VACUUM;

EID: 47249124003     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/30/305705     Document Type: Article

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