Preparing contamination-free mica substrates for surface characterization, force measurements, and imaging

Langmuir

Volumn 20, Issue 9, 2004, Pages 3616-3622

  Israelachvili, Jacob N ^a   Alcantar, Norma A ^a,b   Maeda, Nobuo ^a   Mates, Thomas E ^a   Ruths, Marina ^c  

^a University of California   (United States)

^b University of South Florida   (United States)

^c ÅBO AKADEMI UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA); FRINGES OF EQUAL CHROMATIC ORDER (FECO); PARTICLE CONTAMINATION; SURFACE FORCES APPARATUS (SFA);

ADSORPTION; ELLIPSOMETRY; FORCE MEASUREMENT; FRICTION; IMAGING TECHNIQUES; REFRACTIVE INDEX; RHEOLOGY; SECONDARY ION MASS SPECTROMETRY; VAN DER WAALS FORCES; VISCOSITY; X RAY PHOTOELECTRON SPECTROSCOPY;

MICA;

ADSORPTION; FORCE; MICA; REFRACTIVITY; VISCOSITY;

EID: 2342448578     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0352974     Document Type: Article

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