Fine atomic image of mica cleavage planes obtained with an atomic force (AFM) and a novel procedure for image processing

Chemical Physics

Volumn 221, Issue 1-2, 1997, Pages 23-31

  Baba, Miyuki ^a,d   Kakitani, Satoru ^a   Ishii, Hiroshi ^b   Okuno, Tadashi ^c  

^a OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

^b Okayama Ceramics Research Foundation   (Japan)

^c Oyokoden Lab Co   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040600629     PISSN: 03010104     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0301-0104(97)00141-9     Document Type: Article

References (10)

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