Scanning tunneling microscopy characterization of the surface morphology of copper films grown on mica and quartz

Thin Solid Films

Volumn 489, Issue 1-2, 2005, Pages 325-329

  Lee, S M ^a   Krim, J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Copper; Morphology; Quartz; Scanning tunneling microscopy (STM)

Indexed keywords

COMPUTER SIMULATION; COPPER; FILM GROWTH; METALLIC FILMS; MICA; MORPHOLOGY; QUARTZ; SCANNING TUNNELING MICROSCOPY; SURFACES;

ATOMICALLY FLAT FILMS; CRYSTALLINITY; SCALING THEORY; SELF-AFFINE SURFACES;

THIN FILMS;

EID: 23244457426     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.05.014     Document Type: Article

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