Axial sub-nanometer accuracy in digital holographic microscopy

Measurement Science and Technology

Volumn 19, Issue 7, 2008, Pages

  Kuhn J ^a   Charriere F ^a   Colomb, T ^b   Cuche, E ^c   Montfort, F ^c   Emery, Y ^c   Marquet, P ^b   Depeursinge, C ^a  

^a EPFL   (Switzerland)

^b DEPT UNIV DE PSYCHIATRIE ADULTE   (Switzerland)

^c Lyncee Tec SA   (Switzerland)

Author keywords

Digital holography; Non contact; Optical metrology; Phase imaging; Real time

Indexed keywords

CALIBRATION; HOLOGRAPHY; MICROSCOPIC EXAMINATION; NOISE ABATEMENT; PHASE MEASUREMENT;

DIGITAL HOLOGRAPHY; NON-CONTACT; OPTICAL METROLOGY; PHASE IMAGING; REAL TIME;

HOLOGRAMS;

EID: 46749104106     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/7/074007     Document Type: Article

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