Measurements of corner cubes microstructures by high-magnification digital holographic microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6188, Issue , 2006, Pages

  Kühn, Jonas ^a   Cuche, Etienne ^b   Emery, Yves ^b   Colomb, Tristan ^a   Charrière, Florian ^a   Montfort, Frédéric ^b   Botkine, Mikhail ^b   Aspert, Nicolas ^b   Depeursinge, Christian ^a  

^a EPFL   (Switzerland)

^b Lyncee Tec SA   (Switzerland)

Author keywords

Corner cube; Digital holography; High aspect ratio; Metrology; Microscopy; Transparent microstructures

Indexed keywords

MATHEMATICAL MODELS; MICROOPTICS; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; OPTICAL SYSTEMS; REFRACTIVE INDEX; SEMICONDUCTOR LASERS; TOPOLOGY;

CORNER CUBE; DIGITAL HOLOGRAPHY; HIGH ASPECT-RATIO; TRANSPARENT MICROSTRUCTURES;

HOLOGRAPHY;

EID: 33746699654     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.662030     Document Type: Conference Paper

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