A new approach for testing of aspherical micro-optics with high numerical aperture

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4451, Issue , 2001, Pages 345-355

  Kebbel, Volker ^a   Hartmann, Hans Jürgen ^a   Jüptner, Werner P O ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

Aspherical micro optics; Digital holography; High numerical aperture; Two wavelength holography

Indexed keywords

ASPHERICS; HOLOGRAMS; HOLOGRAPHY; IMAGE RECONSTRUCTION; LASER BEAMS; MICROLENSES; MICROOPTICS; NUMERICAL METHODS; SPECKLE;

ASPHERICAL MICRO-OPTICS; DIGITAL HOLOGRAPHY; HIGH NUMERICAL APERTURE; TWO-WAVELENGTH HOLOGRAPHY;

OPTICAL TESTING;

EID: 0035760772     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.453633     Document Type: Conference Paper

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