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Volumn 92, Issue 2, 2008, Pages 267-274

Tribological characteristics of ZnO nanowires investigated by atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CHARGED PARTICLES; CHEMICAL VAPOR DEPOSITION; DIAMONDS; ELECTRIC WIRE; ELECTRON MICROSCOPES; ELECTRONS; EXTREME ULTRAVIOLET LITHOGRAPHY; FRICTION; IMAGING TECHNIQUES; METALLIZING; MICROSCOPES; MICROSCOPIC EXAMINATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; NONMETALS; OPTICAL INSTRUMENTS; OXIDES; SCANNING; SCANNING PROBE MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SILICON; TRANSIENT ANALYSIS; TRIBOLOGY; ZINC; ZINC ALLOYS; ZINC SULFIDE;

EID: 45849116894     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4528-9     Document Type: Article
Times cited : (15)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.