Single-event-upset and alpha-particle emission rate measurement techniques

IBM Journal of Research and Development

Volumn 52, Issue 3, 2008, Pages 265-273

  Gordon, Michael S ^a   Rodbell, Kenneth P ^a   Heidel, David F ^a   Cabral Jr , Cyril ^a   Cannon, Ethan H ^b   Reinhardt, Daniel D ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRY; MATERIALS TESTING; PIGMENTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; URANIUM POWDER METALLURGY; WELL TESTING;

(+ MOD 2N) OPERATION; ALPHA-PARTICLES; CHARGED FRAGMENTS; INTERNATIONAL BUSINESS; LIFE TESTING; MEASUREMENT TECHNIQUES; NEUTRON ENERGIES; PARTICLE EMISSIONS; SEU TESTING; SINGLE EVENT UPSET (SEU); SINGLE EVENT UPSETS (SEUS);

PACKAGING MATERIALS;

EID: 45749092183     PISSN: 00188646     EISSN: 00188646     Source Type: Journal    
DOI: 10.1147/rd.523.0265     Document Type: Article

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