Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Review of Scientific Instruments

Volumn 75, Issue 11, 2004, Pages 5035-5037

  Kim, Byung I ^a,b  

^a University of Houston   (United States)

^b BOISE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING SURFACE; DIRECT RESONANCE OSCILLATOR (DRO); PHASE LOCKED OSCILLATOR; POSITION SENSITIVE PHOTODIODES (PSD);

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; INSULATING MATERIALS; OSCILLATORS (ELECTRONIC); RESONANCE; ULTRAHIGH VACUUM; VIBRATION CONTROL;

PHASE LOCKED LOOPS;

EID: 10844277061     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1806998     Document Type: Article

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