Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM

Ultramicroscopy

Volumn 106, Issue 4-5, 2006, Pages 277-283

  Wang, P ^a   Bleloch, A L ^b   Falke, U ^b   Goodhew, P J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b SUPERSTEM LABORATORY   (United Kingdom)

Author keywords

Fringes; Gold; HAADF; Lattice contrast; Nanocrystal; Polycrystalline silicon; STEM

Indexed keywords

IMAGING SYSTEMS; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; POLYSILICON; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

FRINGES; HAADF; LATTICE CONTRAST; NANOCRYSTAL; STEM;

LATTICE CONSTANTS;

ARTICLE; CRYSTALLIZATION; CRYSTALLOGRAPHY; FOURIER ANALYSIS; GEOMETRY; NANOCRYSTAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STEREORADIOGRAPHY; VISIBILITY;

EID: 33344476797     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.09.005     Document Type: Article

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