Reliability of power electronic devices against cosmic radiation-induced failure

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1399-1406

  Soelkner, G ^a   Kaindl, W ^b   Schulze, H J ^a   Wachutka, G ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; ELECTRIC BREAKDOWN; ELECTRIC COILS; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT; FAILURE (MECHANICAL); HARDNESS; IONIZATION; RELIABILITY; SEMICONDUCTOR DEVICES;

COSMIC RADIATION-INDUCED FAILURE; NUCLEON RADIATION; POWER ELECTRONIC DEVICES;

POWER ELECTRONICS;

EID: 4544365358     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.024     Document Type: Conference Paper

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