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Volumn , Issue , 1998, Pages 516-519

Failure mode of different irradiated power IGBT structures

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; COMPUTER SIMULATION; FAILURE ANALYSIS; HEAVY IONS; ION BOMBARDMENT; MOSFET DEVICES; POWER ELECTRONICS; THYRISTORS; TWO DIMENSIONAL;

EID: 0031619064     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (10)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.