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Volumn , Issue , 1998, Pages 516-519
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Failure mode of different irradiated power IGBT structures
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR TRANSISTORS;
COMPUTER SIMULATION;
FAILURE ANALYSIS;
HEAVY IONS;
ION BOMBARDMENT;
MOSFET DEVICES;
POWER ELECTRONICS;
THYRISTORS;
TWO DIMENSIONAL;
INSULATED GATE BIPOLAR TRANSISTORS;
NON PUNCH THROUGH STRUCTURE;
POWER SWITCHING DEVICES;
PUNCH THROUGH STRUCTURE;
RADIATION EFFECTS;
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EID: 0031619064
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (10)
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