Evolution of the optical properties of Si nanoparticles embedded in SiO2 as function of annealing conditions

Journal of Applied Physics

Volumn 103, Issue 11, 2008, Pages

  Stenger, I ^a   Gallas, B ^a   Siozade, L ^a   Kao, C C ^b   Chenot, S ^a   Fisson, S ^a   Vuye, G ^a   Rivory, J ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC SPECTROSCOPY; MICROFLUIDICS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; OPTICAL MATERIALS; OPTICAL PROPERTIES; POLYSILICON; SEMICONDUCTING CADMIUM TELLURIDE; SILICA; SILICATE MINERALS; SILICON; SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

(PL) PROPERTIES; CRYSTALLINE FRACTIONS; DIELECTRIC FUNCTIONS; EVOLUTION (CO); FINE GRAINED; OPTICAL (PET) (OPET); PHOTO THERMAL; PHOTON ENERGIES; POLY-SI; POLYCRYSTALLINE-SI; SI NANO-PARTICLES;

NANOPARTICLES;

EID: 45149129683     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2937086     Document Type: Article

References (35)

1. L. T. Canham, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.103561 57, 1046 (1990).
2. C. Delerue, G. Allan, and M. Lannoo, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.48.11024 48, 11024 (1993).
3. M. V. Wolkin, J. Jorne, P. M. Fauchet, G. Allan, and C. Delerue, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.82.197 82, 197 (1999).
4. L. E. Ramos, J. Furthmüller, and F. Berchstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.033311 70, 033311 (2004).
5. B. Garrido, M. Lopez, A. Perez-Rodriguez, C. Garcia, P. Pellegrino, R. Ferre, J. A. Moreno, J. R. Morante, C. Bonafos, M. Carrada, A. Claverie, J. de la Torre, and A. Souifi, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 10.1016/j.nimb.2003.11.037 216, 213 (2004).
6. L.-W. Wang and A. Zunger, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.73.1039 73, 1039 (1994).
7. H.-Ch. Weissker, J. Furthmüller, and F. Berchstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.155327 65, 155327 (2002); H.-Ch. Weissker, J. Furthmüller, and F. Berchstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.155328 65, 155328 (2005).
8. N. Koshida, H. Koyama, Y. Suda, Y. Yamamoto, M. Araki, T. Saito, K. Sato, N. Sata, and S. Shin, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.110330 63, 2774 (1993).
9. B. Gallas, I. Stenger, C.-C. Kao, S. Fisson, G. Vuye, and J. Rivory, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.155319 72, 155319 (2005).
10. L. Ding, T. P. Chen, Y. Liu, M. Yang, J. I. Wong, Y. C. Liu, A. D. Trig, F. R. Zhu, M. C. Tan, and S. Fung, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2730560 101, 103525 (2007).
11. S. Charvet, R. Madelon, F. Gourbilleau, and R. Rizk, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.370307 85, 4032 (1999).
12. T. P. Chen, Y. Liu, M. S. Tse, O. K. Tan, P. F. Ho, K. Y. Liu, D. Gui, and A. L. K. Tan, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.153301 68, 153301 (2003).
13. D. Amans, S. Collard, A. Gagnaire, J. Joseph, G. Ledoux, and F. Huisken, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1538344 93, 4173 (2003).
14. M. Losurdo, M. M. Giangregorio, P. Capezzuto, G. Bruno, M. F. Cerqueira, E. Alves, and M. Stepikhova, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1569052 82, 2993 (2003).
15. H. V. Nguyen, Y. Lu, S. Kim, M. Wakagi, and R. W. Collins, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.74.3880 74, 3880 (1995).
16. J. A. Moreno, B. Garrido, P. Pellegrino, C. Garcia, J. Arbiol, J. R. Morante, P. Marie, F. Gourbilleau, and R. Rizk, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1943512 98, 013523 (2005).
17. E. Lioudakis, A. Othonos, G. C. Hadjisavvas, P. C. Kelires, and A. G. Nassiopoulou, Physica E (Amsterdam) PELNFM 1386-9477 10.1016/j.physe.2006.12.020 38, 128 (2007).
18. U. Kahler and H. Hofmeister, Opt. Mater. (Amsterdam, Neth.) OMATET 0925-3467 10.1016/S0925-3467(01)00024-6 17, 83 (2001).
19. R. Tsu, J. Gonzalez-Hernandez, S. S. Chao, S. C. Lee, and K. Tanaka, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.93133 40, 534 (1982); I. Gregora, B. Champagnon, and A. Halimaoui, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.356149 75, 3034 (1994).
20. E. Bustarret, M. Hachicha, and M. Brunel, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.99054 52, 1675 (1988).
21. D. Kovalev, H. Heckler, G. Polisski, J. Diener, and F. Koch, Opt. Mater. (Amsterdam, Neth.) OMATET 0925-3467 10.1016/S0925-3467(01)00017-9 17, 35 (2001); J. Valenta, R. Juhasz, and J. Linnros, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1448400 80, 1070 (2002).
22. J. Heitmann, R. Scholz, M. Schmidt, and M. Zacharias, J. Non-Cryst. Solids JNCSBJ 0022-3093 299-302, 1075 (2002); K. Watanabe, M. Fujii, and S. Hayashi, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1409572 90, 4761 (2001).
23. G. E. Jellison, M. F. Chisholm, and S. M. Gorbartkin, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.109067 62, 3348 (1993).
24. W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier, Appl. Opt. APOPAI 0003-6935 20, 1333 (1981).
25. W. B. Jackson, N. M. Johnson, and D. K. Biegelsen, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.94278 43, 195 (1983).
26. I. Stenger, L. Siozade, B. Gallas, S. Fisson, G. Vuye, and J. Rivory, Surf. Sci. SUSCAS 0039-6028 601, 2912 (2007).
27. H. R. Philipp and H. Ehrenreich, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.8.92 8, 92 (1962).
28. I. Stenger, B. Gallas, L. Siozade, S. Fisson, G. Vuye, S. Chenot, and J. Rivory, Physica E (Amsterdam) PELNFM 1386-9477 38, 176 (2007).
29. F. Iacona, C. Bongiorno, C. Spinella, S. Boninelli, and F. Priolo, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1664026 95, 3723 (2004).
30. M. A. Laguna, V. Paillard, B. Kohn, M. Ehbrecht, F. Huisken, G. Ledoux, R. Papoular, and H. Hofmeister, J. Lumin. JLUMA8 0022-2313 10.1016/S0022- 2313(98)00102-1 80, 223 (1999).
31. A. Puzder, A. J. Williamson, J. C. Grossman, and G. Galliet, J. Am. Chem. Soc. JACSAT 0002-7863 10.1021/ja0293296 125, 2786 (2003).
32. N. Koshida, H. Koyoama, Y. Suda, Y. Yamamoto, M. Araki, T. Saito, K. Sato, N. Sata, and S. Shin, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.110330 63, 2774 (1993).
33. D. Kovalev, G. Polisski, M. Ben-Chorin, J. Diener, and F. Koch, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.363595 80, 5978 (1996).
34. A. Janotta, Y. Dikce, M. Schmidt, C. Eisele, M. Stutzmann, M. Luysberg, and L. Houben, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1667008 95, 4060 (2004).
35. L. Ding, T. P. Chen, Y. Liu, C. Y. Ng, and S. Fung, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.125419 72, 125419 (2005).