Optical properties of nanocrystalline silicon thin films produced by size-selected cluster beam deposition

Journal of Luminescence

Volumn 80, Issue 1-4, 1998, Pages 223-228

  Laguna, M A ^a   Paillard, V ^a   Kohn, B ^b   Ehbrecht, M ^b   Huisken, F ^b   Ledoux, G ^c   Papoular, R ^c   Hofmeister, H ^d  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION   (Germany)

^c DIF   (France)

^d MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

High resolution electron microscopy; Nanocrystalline thin film; Photoluminescence; Raman spectroscopy; Silicon cluster

Indexed keywords

EID: 0347053431     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2313(98)00102-1     Document Type: Article

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