Quantum confinement and interface structure of Si nanocrystals of sizes 3-5 nm embedded in a-SiO2

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 38, Issue 1-2, 2007, Pages 128-134

  Lioudakis, Emmanouil ^a   Othonos, Andreas ^a   Hadjisavvas, G C ^b   Kelires, P C ^b   Nassiopoulou, A G ^c  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b UNIVERSITY OF CRETE   (Greece)

^c INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

Monte Carlo simulations; Optical properties; Silicon nanocrystals; Spectroscopic ellipsometry

Indexed keywords

COMPUTER SIMULATION; ENERGY GAP; MONTE CARLO METHODS; QUANTUM CONFINEMENT; SILICA; SILICON; SPECTROSCOPIC ELLIPSOMETRY;

AMORPHOUS SILICA; QUANTUM CONFINEMENT MODELS; SILICON NANOCRYSTALS;

NANOCRYSTALS;

EID: 34147101166     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2006.12.020     Document Type: Article

References (38)

1. Wang L.W., and Zunger A. J. Phys. Chem. 98 (1994) 2158
2. Proot J.P., Delerue C., and Allan G. Appl. Phys. Lett. 61 (1992) 1948
3. Delerue C., Allan G., and Lannoo M. Phys. Rev. B 48 (1993) 11024
4. Wolkin M.V., Jorne J., Fauchet P.M., Allan G., and Delerue C. Phys. Rev. Lett. 82 (1999) 197
5. Photopoulos P., Nassiopoulou A.G., Kouvatsos D.N., and Travlos A. Appl. Phys. Lett 76 (2000) 3588
6. In: Nassiopoulou A.G., and Nalwa H.S. (Eds). Encyclopedia of Nanoscience and Nanotechnology vol. 9 (2004), American Scientific Publishers, California 793-813
7. Pavesi L., Dal Negro L., Mazzoleni C., Franzo G., and Priolo F. Nature (London) 408 (2000) 440
8. A.G. Nassiopoulou, A. Solonidou, A. Olzierski, M. Kokonou, E. Tsoi, P. Normand, K. Giannakopoulos, in: Proceedings of the First International Workshop on Semiconductor Nanocrystals, SEMINANO 2005, held in Budapest, vol. 2, 2005, pp. 405-410.
9. Salonidou A., Nassiopoulou A.G., Travlos A., Ioannou-Sougleridis V., and Tsoi E. Nanotechnology 15 (2004) 1233
10. Canham L.T. Appl. Phys. Lett. 57 (1990) 1046
11. Puzder A., Williamson A.J., Grossman J.C., and Galli G. Phys. Rev. Lett. 88 (2002) 097401
12. Vasiliev I., Chelikowsky J.R., and Martin R. Phys. Rev. B 65 (2002) 121302R
13. Iacona F., Franzo G., and Spinella C. J. Appl. Phys. 87 (2000) 1295
14. Garrido B., López M., Pérez-Rodríguez A., García C., Pellegrino P., Ferré R., Moreno J.A., Morante J.R., Bonafos C., Carrada M., Claverie A., de la Torre J., and Souifi A. Nucl. Instrum. Methods Phys. Res. B 216 (2004) 213
15. Luppi M., and Ossicini S. Phys. Rev. B 71 (2005) 035340
16. Hadjisavvas G., and Kelires P.C. Phys. Rev. Lett. 93 (2004) 226104
17. Garrido B., López M., González O., Pérez-Rodríguez A., Morante J.R., and Bonafos C. Appl. Phys. Lett. 77 (2000) 3143
18. Callas B., Stenger I., Kao C.-C., Fisson S., Vuye G., and Rivory J. Phys. Rev. B 72 (2005) 155319
19. Qin G.G., and Li Y.J. Phys. Rev. B 68 (2003) 85309
20. Wang X.X., Zhang J.G., Ding L., Cheng B.W., Ge W.K., Yu J.Z., and Wang Q.M. Phys. Rev. B 72 (2005) 195313
21. Chen T.P., Liu Y., Tse M.S., Ho P.F., Gui D., and Fung S. Appl. Phys. Lett. 81 (2002) 4724
22. Chen T.P., Liu Y., Tse M.S., Tan O.K., Ho P.F., Liu K.Y., Gui D., and Tan A.L.K. Phys. Rev. B 68 (2003) 153301
23. Ding L., Chen T.P., Liu Y., Ng C.Y., Liu Y.C., and Fung S. Appl. Phys. Lett. 87 (2005) 121903
24. Lioudakis E., Nassiopoulou A.G., and Othonos A. Thin Solid Films 496 2 (2006) 253
25. Lioudakis E., and Othonos A. Opt. Eng. 44 2 (2005) 023802
26. R. Azzam, N. Bashara, Ellipsometry and Polarized Light, North-Holland Publishing, 1977, p. 66.
27. Forouhi A.R., and Bloomer I. Phys. Rev. B 38 (1988) 1865
28. Ioannou-Sougleridis V., Nassiopoulou A.G., and Travlos A. Nanotech 14 (2003) 1174
29. Tu Y., and Tersoff J. Phys. Rev. Lett. 84 (2000) 4393 89 (2002) 086192
30. Hamann D.R. Phys. Rev. B 61 (2000) 9899
31. Wooten F., Winer K., and Weaire D. Phys. Rev. Lett. 54 (1985) 1392
32. Aspnes D.E. Thin Solid Films 81 (1981) 249
33. Jellison G.E., Chisholm M.F., and Gorbatkin S.M. Appl. Phys. Lett. 62 (1993) 3348
34. Hull R. Properties of Crystalline Silicon, INSPEC (1999), The Institution of Electrical Engineers, London, UK
35. Ben-Chorin M., Averboukh B., Kovalev D., Polisski G., and Koch F. Phys. Rev. Lett. 77 (1996) 763
36. Buczko R., Pennycook S.J., and Pantelides S.T. Phys. Rev. Lett. 84 (2000) 943
37. Daldosso N., Luppi M., Ossicini S., Degoli E., Magri R., Dalba G., Fornasini P., Grisenti R., Rocca F., Pavesi L., Boninelli S., Priolo F., Spinella C., and Iacona F. Phys. Rev. B 68 (2003) 085327
38. G. Hadjisavvas, P.C. Kelires, Unpublished.