Near infrared absorption of Si nanoparticles embedded in silica films

Surface Science

Volumn 601, Issue 14, 2007, Pages 2912-2916

  Stenger, I ^a   Siozade, L ^a   Gallas, B ^a   Fisson, S ^a   Vuye, G ^a   Rivory, J ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

Interface states; Nanostructures; Photon absorption spectroscopy; Silicon

Indexed keywords

INTERFACE STATES; PHOTON ABSORPTION SPECTROSCOPY; PHOTOTHERMAL DEFLECTION SPECTROSCOPY;

ABSORPTION SPECTRA; DANGLING BONDS; ELLIPSOMETRY; INFRARED ABSORPTION; SILICA; SILICON; THIN FILMS;

NANOPARTICLES;

EID: 34447273133     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.244     Document Type: Article

References (27)

1. Kik P.G., Brongersma M.L., and Polman A. Appl. Phys. Lett. 76 (2000) 2325
2. Pavesi L., Dal Negro L., Mazzoleni C., Franzo G., and Priolo F. Nature 408 (2000) 440
3. Stutzmann M. Philos. Mag. B 60 (1989) 531
4. Jackson W.B., Johnson N.M., and Biegelsen D.K. Appl. Phys. Lett. 43 (1983) 195
5. Jackson W.B. Solid State Commun. 44 (1982) 477
6. Janotta A., Dikce Y., Schmidt M., Eisele C., Stutzmann M., Luysberg M., and Houben L. J. Appl. Phys. 95 (2004) 4060
7. Garrido Fernandez B., Lopez M., Garcia C., Perez-Rodriguez A., Morante J.R., Bonafos C., Carrada M., and Claverie A. J. Appl. Phys. 91 (2002) 798
8. Kovalev D., Heckler H., Polisski G., and Koch F. Phys. Statue Solidi (b) 215 (1999) 871
9. Janotta A., Dikce Y., Linder S., Schmidt M., Janssen R., Stutzmann M., Luysberg M., and Houben L. J. Appl. Phys. 95 (2004) 4046
10. Fujii M., Mimura A., Hayashi S., Yamamoto K., Urakawa C., and Ohta H. J. Appl. Phys. 87 (2000) 1855
11. Stenger I., Gallas B., Siozade L., Fisson S., Vuye G., Chenot S., and Rivory J. Phys. E 38 (2007) 176
12. Iacona F., Bongiorno C., Spinella C., Boninelli S., and Priolo F. J. Appl. Phys. 95 (2004) 3723
13. Watanabe K., Fujii M., and Hayashi S. J. Appl. Phys. 90 (2001) 4761
14. Gallas B., Stenger I., Kao C.-C., Fisson S., Vuye G., and Rivory J. Phys. Rev. B 72 (2005) 155319
15. Jackson W.B., Amer N.M., Boccara A.C., and Fournier D. Appl. Opt. 20 (1981) 1333
16. Godet C., Bouizem Y., Chahed L., El Zawawi I., Thèye M.L., Meaudre M., Meaudre R., Basrour S., and Bruyère J.C. Phys. Rev. B 44 (1991) 5506
17. Kovalev D., Polisski G., Ben-Chorin M., Diener J., and Koch F. J. Appl. Phys. 80 (1996) 5978
18. Laughlin R.B., Joannopoulos J.D., and Chadi D.J. Phys. Rev. B 21 (1980) 5733
19. Hadjisavvas G., and Kelires P.C. Phys. Rev. Lett. 93 (2004) 226104
20. Daldosso N., et al. Phys. Rev. B 68 (2003) 085327
21. Jackson W.B., and Amer N.M. Phys. Rev. B 25 (1982) 5559
22. Wolkin M.V., Jorne J., Fauchet P.M., Allan G., and Delerue C. Phys. Rev. Lett. 82 (1998) 197
23. Prokes S.M., Carlos W.E., Veprek S., and Ossadnik Ch. Phys. Rev. B 58 (1998) 15632
24. Ramos L.E., Furthmüller J., and Bechstedt F. Phys. Rev. B 71 (2005) 035328
25. Brodsky M.H., Title R.S., Weiser K., and Petit G.D. Phys. Rev. B 1 (1970) 2632
26. Poindexter E.H., Caplan P.J., Deal B.E., and Razouk R. J. Appl. Phys. 52 (1981) 879
27. Lopez M., et al. Appl. Phys. Lett. 80 (2002) 1637