Size dependence of refractive index of Si nanoclusters embedded in SiO 2

Journal of Applied Physics

Volumn 98, Issue 1, 2005, Pages

  Moreno, J A ^a   Garrido, B ^a   Pellegrino, P ^a   Garcia, C ^a   Arbiol, J ^a   Morante, J R ^a   Marie, P ^b   Gourbilleau, F ^b   Rizk, R ^b  

^a UNIVERSITY OF BARCELONA   (Spain)

^b UNIVERSITÉ DE CAEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY CONFINEMENT; EXTINCTION COEFFICIENT; NANOCLUSTERS; OPTICAL GAIN;

ELLIPSOMETRY; LIGHT EMITTING DIODES; REFRACTIVE INDEX; RESONANCE; SILICA; SILICON; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; WAVEGUIDES;

NANOSTRUCTURED MATERIALS;

EID: 22944456542     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1943512     Document Type: Article

References (18)

1. G. Franzò, Appl. Phys. A: Mater. Sci. Process. 74, 1 (2002).
2. L. Pavesi, L. Dal Negro, C. Mazzoleni, G. Franzò, and F. Priolo, Nature (London) 408, 440 (2000).
3. M. H. Nayfeh, S. Rao, and N. Barry, Appl. Phys. Lett. 80, 121 (2002).
4. F. Priolo, G. Franzò, F. Iacona, D. Pacifici, and V. Vinciguerra, Mater. Sci. Eng., B 81, 9 (2001).
5. H. S. Han, S. Y. Seo, and J. H. Shin, Appl. Phys. Lett. 79, 4568 (2001).
6. C. Q. Sun, X. W. Sun, B. K. Tay, H. T. Huang, and S. Li, J. Phys. D 34, 3470 (2001).
7. M. Lannoo, C. Delerue, and G. Allan, Phys. Rev. Lett. 74, 3415, (1995).
8. S. Charvet, R. Madelon, F. Gourbilleau, and R. Rizk, J. Appl. Phys. 85, 4032 (1999).
9. S. Charvet, R. Madelon, and R. Rizk, Solid-State Electron. 45, 1505 (2001).
10. D. Amans, S. Callard, A. Gagnaire, J. Joseph, G. Ledoux, and F. Huisken, J. Appl. Phys. 93, 4173 (2003).
11. B. Garrido, M. López, O. González, A. Ṕrez- Rodríguez, J. R. Morante, and C. Bonafos, Appl. Phys. Lett. 77, 20 (2000).
12. B. Garrido, M. López, C. García, A. Ṕrez- Rodríguez, J. R. Morante, C. Bonafos, M. Carrada, and A Claverie, J. Appl. Phys. 91, 2 (2002).
13. P. Pellegrino, J. Appl. Phys. 97, 74312 (2005).
14. D. A. G. Bruggeman, Ann. Phys. 24, 636 (1935).
15. B. Abeles and J. I. Gittleman, Appl. Opt. 15, 10 (1976).
16. P. Y. Yu and M. Cardona, Fundamentals of Semiconductors, Physics and Materials Properties (Springer, Berlin, 1996).
17. G. Dalba, Appl. Phys. Lett. 82, 889 (2003).
18. F. Iacona, C. Bongiorno, C. Spinella, S. Boninelli, and F. Priolo, J. Appl. Phys. 95, 3723 (2004).