Interconnect challenges for nanoscale electronic circuits

JOM

Volumn 56, Issue 10, 2004, Pages 30-31

  Srivastava, Navin ^a   Banerjee, Kaustav ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; COPPER; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTROMIGRATION; ELECTRON SCATTERING; NANOTECHNOLOGY; OPTICAL INTERCONNECTS; RELIABILITY; SEMICONDUCTING SILICON;

CURRENT CARRYING CAPABILITY; INTERCONNECT CHALLENGES; INTERCONNECT DELAY; INTERCONNECT TECHNOLOGIES; NANOSCALE ELECTRONIC CIRCUITS;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 9244253713     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-004-0285-1     Document Type: Article

References (11)

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