Imaging atomic orbitals in STM experiments on a Si(1 1 1)-(7 × 7) surface

Chemical Physics Letters

Volumn 453, Issue 4-6, 2008, Pages 217-221

  Chaika, A N ^a   Myagkov, A N ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY; SILICON;

HIGH RESOLUTION ATOMIC FORCE MICROSCOPY; SILICON APEX ATOM;

SURFACE STRUCTURE;

EID: 44549088177     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2008.01.025     Document Type: Article

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