Possibility of imaging lateral profiles of individual tetrahedral hybrid orbitals in real space

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Julian Chen, C ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRON TUNNELING; FORCE MEASUREMENT; SCANNING TUNNELING MICROSCOPY;

NON CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM); REPRODUCIBILITY; TETRAHEDRAL HYBRID ORBITALS; TUNNELLING CONDUCTANCE DISTRIBUTION;

IMAGING TECHNIQUES;

EID: 33644985996     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S16     Document Type: Article

References (13)

1. Giessibl F J, Hembacher S, Bielefeldt H and Mannhart J 2000 Science 289 422
2. Huang M, Cuma M and Liu F 2003 Phys. Rev. Lett. 90 256101
3. Hug H J, Abdurixit M A, van Schendel P J A, Hoffmann R, Kappenberger P and Baratoff A 2001 Science 291 2509
4. Giessibl F J, Hembacher S, Bielefeldt H and Mannhart J 2001 Science 291 2509
5. Giessibl F J, Bielefeldt H, Hembacher S and Mannhart J 2001 Ann. Phys. (Berlin) 10 887
6. Herz M, Giessibl F J and Mannhart J 2003 Phys. Rev. B 68 45301
7. Hembacher et al 2004 Science 305 380
8. Chen C J 1996 Unified perturbation theory of STM and SFM Scanning Tunneling Microscopy vol III ed R Wiesendanger and H-J Güntherodt (Springer-Verlag) chapter 7
9. See also Chen C J 1993 Introduction to Scanning Tunneling Microscopy (New York: Oxford University Press)
10. Chen C J 2005 Nanotechnology 16 S27
11. Clementi E and Roetti P 1974 At. Data Nucl. Data Tables 14 429
12. Pauling L 1931 J. Am. Chem. Soc. 53 1367
13. Iwamatsu M 2000 J. Chem. Phys. 112 10976