Characteristic dimensions and the micro-mechanisms of fracture and fatigue in 'nano' and 'bio' materials

International Journal of Fracture

Volumn 128, Issue 1, 2004, Pages 1-15

  Ritchie, R O ^a   Kruzic, J J ^a   Muhlstein, C L ^a   Nalla, R K ^a   Stach, E A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Bone; Fatigue; Fracture toughness; MEMS; Polysilicon; Thin films

Indexed keywords

BONE; FATIGUE OF MATERIALS; FATIGUE TESTING; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; POLYSILICON; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

FATIGUE FAILURE; MICROELECTROMECHANICAL SYSTEMS; MICROMECHANISMS; STRESS LIFE FATIGUE;

FRACTURE TOUGHNESS;

EID: 4444342089     PISSN: 03769429     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:FRAC.0000040958.04896.43     Document Type: Article

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