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Volumn 2, Issue , 2004, Pages 116-120

Evolution of Ag3Sn during reflow soldering

Author keywords

Ag3Sn platelets; During reflow soldering

Indexed keywords

AG3SN PLATELETS; DURING REFLOW SOLDERING; ORGANIC SOLDERABLE PRESERVATIVE (OSP); SOLID-STATE AGEING;

EID: 4444337085     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (23)
  • 1
    • 4444274194 scopus 로고    scopus 로고
    • Website: lead-free.org/legislation.
  • 2
    • 4444351587 scopus 로고    scopus 로고
    • Website: www.nemi.org/PbFreePublic.
  • 5
    • 0037395107 scopus 로고    scopus 로고
    • Solderability testing of 95.5Sn-3.9Ag-0.6Cu solder on oxygen-free high-conductivity copper and Au-Ni-plated kovar
    • E.P. Lopez, P.T. Vianco, and J.A. Rejent, 'Solderability Testing of 95.5Sn-3.9Ag-0.6Cu Solder On Oxygen-Free High-Conductivity Copper and Au-Ni-Plated Kovar' J. of Electronic Materials Vol. 32, No.4, pp254, 2003.
    • (2003) J. of Electronic Materials , vol.32 , Issue.4 , pp. 254
    • Lopez, E.P.1    Vianco, P.T.2    Rejent, J.A.3
  • 6
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • K. Zeng, K. N. Tu, "Six Cases of reliability study of Pb-free solder joints in electronic packaging technology" A Review Journal Report of Materials Science and Engineering R38, pp 55, 2002
    • (2002) A Review Journal Report of Materials Science and Engineering , vol.R38 , pp. 55
    • Zeng, K.1    Tu, K.N.2
  • 7
    • 0036477480 scopus 로고    scopus 로고
    • Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb free solder (Sn3.5Ag, Sn3.8Ag0.7Cu and Sn0.7Cu) on Cu
    • Feb
    • T.Y. Lee, et. al, "Morphology, Kinetics, and thermodynamics of Solid-State aging of eutectic SnPb and Pb Free Solder (Sn3.5Ag, Sn3.8Ag0.7Cu and Sn0.7Cu) on Cu" J. Mater. Res. Vol 17, No. 2, pg 291, Feb 2002.
    • (2002) J. Mater. Res. , vol.17 , Issue.2 , pp. 291
    • Lee, T.Y.1
  • 8
    • 0037463944 scopus 로고    scopus 로고
    • Effects of intermetallic compounds on properties of SnAgCu lead free solder joint
    • K.S. Kim, S.H. Huh, K. Suganuma, "Effects of intermetallic compounds on properties of SnAgCu Lead Free Solder Joint" J. of Alloys and Compounds Vol 352, pp 226, 2003
    • (2003) J. of Alloys and Compounds , vol.352 , pp. 226
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3
  • 9
    • 0036648147 scopus 로고    scopus 로고
    • Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
    • Jul
    • M. Li et al, "Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films" J. Mater. Res. Vol 17, No. 7, pp 1612, Jul 2002.
    • (2002) J. Mater. Res. , vol.17 , Issue.7 , pp. 1612
    • Li, M.1
  • 11
    • 0036612341 scopus 로고    scopus 로고
    • Aspects of the structural evolution of lead-free solder joints
    • Zribi, A. et al.,"Aspects of the Structural Evolution of Lead-Free Solder Joints", J OM, 6, pp 38, 2002
    • (2002) J OM , vol.6 , pp. 38
    • Zribi, A.1
  • 12
    • 0035455153 scopus 로고    scopus 로고
    • The growth of intermetallic compounds and the associated evolution of the solder microstructure
    • Zribi, A. et al., "The Growth of Intermetallic Compounds and the Associated Evolution of the Solder Microstructure", Journal of Elecronic Materials, 30, p1157, 2001
    • (2001) Journal of Elecronic Materials , vol.30 , pp. 1157
    • Zribi, A.1
  • 13
    • 0036477472 scopus 로고    scopus 로고
    • Effect of Cu concentration on the interfacial reactions between Ni and Sn-Cu solder
    • Feb
    • W.T. Chen, C.E. Ho and C.R. Kao, 'Effect of Cu concentration on the interfacial reactions between Ni and Sn-Cu solder' J. Mater. Res. Vol. 17, No.2, pp 263, Feb 2002.
    • (2002) J. Mater. Res. , vol.17 , Issue.2 , pp. 263
    • Chen, W.T.1    Ho, C.E.2    Kao, C.R.3
  • 14
    • 0035305461 scopus 로고    scopus 로고
    • Interaction between solder and metallization during long-term aging of advanced microelectronic packaging
    • C.E. Ho, W.T. Chen, and C.R. Kao 'Interaction between Solder and Metallization During Long-Term Aging of Advanced Microelectronic Packaging' J. Electron. Mater Vol. 30, No. 3, pp 379, 2001.
    • (2001) J. Electron. Mater , vol.30 , Issue.3 , pp. 379
    • Ho, C.E.1    Chen, W.T.2    Kao, C.R.3
  • 18
    • 36749115389 scopus 로고
    • Relative rates of Ni diffusion and Cu diffusion through Au
    • Jul
    • H.G Tompkins and M.R. Pinnel 'Relative rates of Ni diffusion and Cu diffusion through Au' J. Appl. Phys, Vol. 48, No 7, pp 3144, Jul 1977.
    • (1977) J. Appl. Phys , vol.48 , Issue.7 , pp. 3144
    • Tompkins, H.G.1    Pinnel, M.R.2
  • 19
    • 4444245952 scopus 로고    scopus 로고
    • The growth of IMC thickness during reflow soldering
    • SF Tai, and C K Chung, 'The growth of IMC thickness during reflow soldering' Intel Internal report, 2003.
    • (2003) Intel Internal Report
    • Tai, S.F.1    Chung, C.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.