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Volumn 516, Issue 17, 2008, Pages 5903-5906

Fabrication and characterization of In-Ga-Zn-O/NiO structures

Author keywords

Amorphous films; In Ga Zn O films; NiO film; Pn junctions

Indexed keywords

NICKEL COMPOUNDS; OXIDE FILMS; THRESHOLD VOLTAGE;

EID: 44349087158     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.10.056     Document Type: Article
Times cited : (12)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.