Fabrication and characterisation of NiO/ZnO structures

Sensors and Actuators, B: Chemical

Volumn 100, Issue 1-2, 2004, Pages 270-276

  Nel, J M ^a   Auret, F D ^a,b   Wu, L ^a   Legodi, M J ^a   Meyer, W E ^a   Hayes, M ^a  

^a UNIVERSITY OF PRETORIA   (South Africa)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Electrical properties; Nickel oxide; Rectifying junction; Zinc oxide

Indexed keywords

COMPOSITION; ELECTRON BEAMS; MOS DEVICES; NICKEL COMPOUNDS; OPTICAL PROPERTIES; OXIDATION; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SCHOTTKY BARRIER DIODES; THERMAL EFFECTS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ALPHA-PARTICLE BOMBARDMENT; ELECTRICAL PROPERTIES; NICKEL OXIDE; RECTIFYING JUNCTION;

ZINC OXIDE;

EID: 2342539699     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2003.12.054     Document Type: Article

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