-
2
-
-
0002800739
-
Newton, Fizeau and Haidinger interferometers
-
D. Malacara. New York: Wiley
-
Mantravadi M.V. Newton, Fizeau and Haidinger interferometers. Malacara D. Optical shop testing. 1992;19-36 Wiley, New York.
-
(1992)
Optical Shop Testing
, pp. 19-36
-
-
Mantravadi, M.V.1
-
3
-
-
0016128770
-
Digital wave-front measuring interferometer for testing optical surfaces and lenses
-
Bruning J.H., Herriott D.R., Gallagher J.E., Rossenfeld D.P., White A.D., Brangaccio D.J. Digital wave-front measuring interferometer for testing optical surfaces and lenses. Appl Opt. 13:1974;2693-2703.
-
(1974)
Appl Opt
, vol.13
, pp. 2693-2703
-
-
Bruning, J.H.1
Herriott, D.R.2
Gallagher, J.E.3
Rossenfeld, D.P.4
White, A.D.5
Brangaccio, D.J.6
-
4
-
-
77956978378
-
Phase measurement interferometry techniques
-
E. Wolf. Amsterdam: North-Holland
-
Creath K. Phase measurement interferometry techniques. Wolf E. Progress in optics, xxvi. 1988;349-393 North-Holland, Amsterdam.
-
(1988)
Progress in Optics
, vol.26
, pp. 349-393
-
-
Creath, K.1
-
5
-
-
77956979212
-
Advanced evaluation technique in interferometry
-
E. Wolf. Amsterdam: North-Holland
-
Schwider J. Advanced evaluation technique in interferometry. Wolf E. Progress in optics, xxviii. 1990;271-359 North-Holland, Amsterdam.
-
(1990)
Progress in Optics
, vol.28
, pp. 271-359
-
-
Schwider, J.1
-
6
-
-
0001418962
-
Phase shifting interferometry
-
D. Malacara. New York: Wiley
-
Greivenkamp J.E., Bruning J.H. Phase shifting interferometry. Malacara D. Optical shop testing. 1992;506-588 Wiley, New York.
-
(1992)
Optical Shop Testing
, pp. 506-588
-
-
Greivenkamp, J.E.1
Bruning, J.H.2
-
7
-
-
0032647540
-
300-mm aperture phase-shifting Fizeau interferometer
-
Falrmn P.S., Ward B.K., Oreb B.F., Farrant D.I., Giliand Y., Freund C.H., Leistner A.J., Seckold J.A., Walsh C.J. 300-mm aperture phase-shifting Fizeau interferometer. Opt Eng. 38:1999;1371-1380.
-
(1999)
Opt Eng
, vol.38
, pp. 1371-1380
-
-
Falrmn, P.S.1
Ward, B.K.2
Oreb, B.F.3
Farrant, D.I.4
Giliand, Y.5
Freund, C.H.6
Leistner, A.J.7
Seckold, J.A.8
Walsh, C.J.9
-
8
-
-
84975646119
-
Sinusoidal phase modulating Fizeau interferometer
-
Sasaki O., Okamura T., Nakamura T. Sinusoidal phase modulating Fizeau interferometer. Appl Opt. 29:1990;512-515.
-
(1990)
Appl Opt
, vol.29
, pp. 512-515
-
-
Sasaki, O.1
Okamura, T.2
Nakamura, T.3
-
9
-
-
0035465855
-
Fizeau interferometer for phase shifting interferometry in ultrahigh vacuum
-
Kaiser S., Maier T., Grossmann A., Zimmermann C. Fizeau interferometer for phase shifting interferometry in ultrahigh vacuum. Rev Sci Instrum. 72:2001;3726-3727.
-
(2001)
Rev Sci Instrum
, vol.72
, pp. 3726-3727
-
-
Kaiser, S.1
Maier, T.2
Grossmann, A.3
Zimmermann, C.4
-
10
-
-
84975625095
-
Homogeneity testing by phase sampling interferometry
-
Schwider J., Burow R., Elssner K.E., Spolaczyk R., Grzanna J. Homogeneity testing by phase sampling interferometry. Appl Opt. 24:1985;3059-3061.
-
(1985)
Appl Opt
, vol.24
, pp. 3059-3061
-
-
Schwider, J.1
Burow, R.2
Elssner, K.E.3
Spolaczyk, R.4
Grzanna, J.5
-
11
-
-
0000002167
-
Measurement of the inhomogeneity of a window
-
Ai C., Wyant J.C. Measurement of the inhomogeneity of a window. Opt Eng. 30:1991;1399-1404.
-
(1991)
Opt Eng
, vol.30
, pp. 1399-1404
-
-
Ai, C.1
Wyant, J.C.2
-
12
-
-
0036541215
-
Phase shifting interferometry: Measurements with high-reflectance surfaces
-
Hariharan P. Phase shifting interferometry: measurements with high-reflectance surfaces. Opt Eng. 41:2002;856-859.
-
(2002)
Opt Eng
, vol.41
, pp. 856-859
-
-
Hariharan, P.1
-
13
-
-
0141645327
-
Dynamic interferometry
-
Wyant J.C. Dynamic interferometry. Opt Phot News. 14(1):2003;38-41.
-
(2003)
Opt Phot News
, vol.14
, Issue.1
, pp. 38-41
-
-
Wyant, J.C.1
-
14
-
-
0027576544
-
Application of real time phase shift interferometer to the measurement of concentration field
-
Onuma K., Tsukamoto K., Nakadate S. Application of real time phase shift interferometer to the measurement of concentration field. J Crystal Growth. 129:1993;706-718.
-
(1993)
J Crystal Growth
, vol.129
, pp. 706-718
-
-
Onuma, K.1
Tsukamoto, K.2
Nakadate, S.3
-
15
-
-
2542552225
-
Production and measurement of super-polished surfaces
-
Wingerden J.V., Frankena H.J., Zwan B.A.V.D. Production and measurement of super-polished surfaces. Opt Eng. 31:1992;2450-2457.
-
(1992)
Opt Eng
, vol.31
, pp. 2450-2457
-
-
Wingerden, J.V.1
Frankena, H.J.2
Zwan, B.A.V.D.3
-
16
-
-
0043152847
-
Phase stepping DIC technique for reflecting surface evaluation
-
Pluta M, Szyjer M. editors. Phase contrast and differential interference contrast imaging techniques and applications
-
Sochacka M, Staronski LR. Phase stepping DIC technique for reflecting surface evaluation. In: Pluta M, Szyjer M. editors. Phase contrast and differential interference contrast imaging techniques and applications. Proc SPIE 1992;1846:222-33.
-
(1992)
Proc SPIE
, vol.1846
, pp. 222-233
-
-
Sochacka, M.1
Staronski, L.R.2
-
17
-
-
0036478027
-
Phase shifting birefringent scatterplate interferometer
-
North-Morris M.B., VanDelden J., Wyant J.C. Phase shifting birefringent scatterplate interferometer. Appl Opt. 41:1997;668-677.
-
(1997)
Appl Opt
, vol.41
, pp. 668-677
-
-
North-Morris, M.B.1
Vandelden, J.2
Wyant, J.C.3
-
18
-
-
0032661548
-
Phase stepping in Lao interferometry
-
Angel L., Tebaldi M., Henao R. Phase stepping in Lao interferometry. Opt Commun. 164:1999;247-255.
-
(1999)
Opt Commun
, vol.164
, pp. 247-255
-
-
Angel, L.1
Tebaldi, M.2
Henao, R.3
-
19
-
-
0000739080
-
Phase shifting method with a normal polariscope
-
Asundi A., Tong L., Boay C.G. Phase shifting method with a normal polariscope. Appl Opt. 38:1999;5931-5935.
-
(1999)
Appl Opt
, vol.38
, pp. 5931-5935
-
-
Asundi, A.1
Tong, L.2
Boay, C.G.3
-
20
-
-
0000882967
-
Phase shifting point diffraction interferometry at 193 nm
-
Lee S.H., Naulleau P., Goldberg K.A., Piao F., Oldham W., Bokar J. Phase shifting point diffraction interferometry at. 193 nm Appl Opt. 39:2000;5768-5772.
-
(2000)
Appl Opt
, vol.39
, pp. 5768-5772
-
-
Lee, S.H.1
Naulleau, P.2
Goldberg, K.A.3
Piao, F.4
Oldham, W.5
Bokar, J.6
-
23
-
-
0020844269
-
Digital wave-front measuring interferometry some systematic error sources
-
Schwider J., Burow R., Elssner K.E., Grzanna J., Spolaczyk R., Merkel K. Digital wave-front measuring interferometry some systematic error sources. Appl Opt. 22:1983;3421-3432.
-
(1983)
Appl Opt
, vol.22
, pp. 3421-3432
-
-
Schwider, J.1
Burow, R.2
Elssner, K.E.3
Grzanna, J.4
Spolaczyk, R.5
Merkel, K.6
-
24
-
-
0022948569
-
Comparison of phase measurement algorithms
-
Creath K, editor. Surface characterization and testing
-
Creath K. Comparison of phase measurement algorithms. In: Creath K, editor. Surface characterization and testing. Proc SPIE 1986; 680:19-28.
-
(1986)
Proc SPIE
, vol.680
, pp. 19-28
-
-
Creath, K.1
-
25
-
-
0033734653
-
Phase shifting interferometry: Minimization of systematic errors
-
Hariharan P. Phase shifting interferometry: minimization of systematic errors. Opt Eng. 39:2000;967-969.
-
(2000)
Opt Eng
, vol.39
, pp. 967-969
-
-
Hariharan, P.1
-
26
-
-
0000002507
-
Some considerations of reduction of reference phase error in phase stepping interferometry
-
Schwider J., Dresel T., Manzke B. Some considerations of reduction of reference phase error in phase stepping interferometry. Appl Opt. 38:1999;655-659.
-
(1999)
Appl Opt
, vol.38
, pp. 655-659
-
-
Schwider, J.1
Dresel, T.2
Manzke, B.3
-
27
-
-
0036279110
-
Phase stepping interferometry: Methods for reducing errors caused by camera nonlinearities
-
Schodel R., Nicolaus A., Bonsch G. Phase stepping interferometry: methods for reducing errors caused by camera nonlinearities. Appl Opt. 41:2002;55-63.
-
(2002)
Appl Opt
, vol.41
, pp. 55-63
-
-
Schodel, R.1
Nicolaus, A.2
Bonsch, G.3
-
28
-
-
0032615081
-
Phase step calibration for phase stepped interferometry
-
Brug H.V. Phase step calibration for phase stepped interferometry. Appl Opt. 38:1999;3549-3555.
-
(1999)
Appl Opt
, vol.38
, pp. 3549-3555
-
-
Brug, H.V.1
-
29
-
-
85075149702
-
Optical testing with large liquid flats
-
Advances and fabrication and metrology for optics and large optics
-
Ketelsen DA, Anderson DS. Optical testing with large liquid flats. In: Advances and fabrication and metrology for optics and large optics. Proc SPIE 1988;966:365-71.
-
(1988)
Proc SPIE
, vol.966
, pp. 365-371
-
-
Ketelsen, D.A.1
Anderson, D.S.2
-
30
-
-
0000098809
-
Multimode laser Fizeau interferometer for measuring the surface of a thin transparent plate
-
Ai C. Multimode laser Fizeau interferometer for measuring the surface of a thin transparent plate. Appl Opt. 36:1997;8135-8138.
-
(1997)
Appl Opt
, vol.36
, pp. 8135-8138
-
-
Ai, C.1
-
31
-
-
84928815585
-
Digital phase shifting interferometry: A simple error-compensating phase calculation algorithm
-
Hariharan P., Oreb B.F., Eiju T. Digital phase shifting interferometry: a simple error-compensating phase calculation algorithm. Appl Opt. 26:1987;2504-2505.
-
(1987)
Appl Opt
, vol.26
, pp. 2504-2505
-
-
Hariharan, P.1
Oreb, B.F.2
Eiju, T.3
-
32
-
-
0036611660
-
Innovative phase unwrapping algorithm: Hybrid approach
-
Huang M.J., Lai C.J. Innovative phase unwrapping algorithm: hybrid approach. Opt Eng. 41(6):2002;1376-1386.
-
(2002)
Opt Eng
, vol.41
, Issue.6
, pp. 1376-1386
-
-
Huang, M.J.1
Lai, C.J.2
-
33
-
-
0010750326
-
Absolute figure measurements with a liquid-flat reference
-
Powell I., Goulet E. Absolute figure measurements with a liquid-flat reference. Appl Opt. 37:1998;2579-2588.
-
(1998)
Appl Opt
, vol.37
, pp. 2579-2588
-
-
Powell, I.1
Goulet, E.2
-
34
-
-
0027653723
-
Absolute testing of flats by using even and odd functions
-
Ai C., Wyant J.C. Absolute testing of flats by using even and odd functions. Appl Opt. 32:1993;4698-4705.
-
(1993)
Appl Opt
, vol.32
, pp. 4698-4705
-
-
Ai, C.1
Wyant, J.C.2
-
35
-
-
0001001672
-
Calibration of a 300-mm aperture phase-shifting Fizeau interferometer
-
Oreb B.F., Farrant D.I., Walsh C.J., Forbes G., Falrmn P.S. Calibration of a 300-mm aperture phase-shifting Fizeau interferometer. Appl Opt. 39:2000;5161-5171.
-
(2000)
Appl Opt
, vol.39
, pp. 5161-5171
-
-
Oreb, B.F.1
Farrant, D.I.2
Walsh, C.J.3
Forbes, G.4
Falrmn, P.S.5
-
36
-
-
0038102928
-
Phase shift calibration algorithm for phase shifting interferometry
-
Chen X., Gramaglia M., Yeazell A. Phase shift calibration algorithm for phase shifting interferometry. J Opt Soc Am. 17(11):2000;2061-2066.
-
(2000)
J Opt Soc Am
, vol.17
, Issue.11
, pp. 2061-2066
-
-
Chen, X.1
Gramaglia, M.2
Yeazell, A.3
|