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Volumn 41, Issue 1, 2002, Pages 55-63

Phase-stepping interferometry: Methods for reducing errors caused by camera nonlinearities

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; HYSTERESIS; NUMERICAL ANALYSIS; OPTICAL FIBERS; PHASE MEASUREMENT; SPURIOUS SIGNAL NOISE;

EID: 0036279110     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.000055     Document Type: Article
Times cited : (36)

References (10)
  • 1
    • 0002834304 scopus 로고
    • Installation et utilisation du comparateur photoelec-trique et interferentiel du Bureau International des Poids et Mesures
    • P. Carre, “Installation et utilisation du comparateur photoelec-trique et interferentiel du Bureau International des Poids et Mesures, ” Metrologia 2, 13-23 (1966).
    • (1966) Metrologia , vol.2 , pp. 13-23
    • Carre, P.1
  • 3
    • 0022862521 scopus 로고
    • Automatic fringe pattern analysis: A review
    • G. T. Reid, “Automatic fringe pattern analysis: a review, ” Opt. Lasers Eng. 7, 37-68 (1986).
    • (1986) Opt. Lasers Eng. , vol.7 , pp. 37-68
    • Reid, G.T.1
  • 4
    • 77956979218 scopus 로고
    • Interferometry with lasers
    • E. Wolf, ed. (Elsevier, Amsterdam
    • P. Hariharan, “Interferometry with lasers, ” in Progress in Optics, E. Wolf, ed. (Elsevier, Amsterdam, 1987), Vol. 24, pp. 103-164.
    • (1987) Progress in Optics , vol.24 , pp. 103-164
    • Hariharan, P.1
  • 5
    • 0002988472 scopus 로고
    • Temporal phase measuring methods
    • D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, UK
    • K. Creath, “Temporal phase measuring methods, ” in Interfero-gram Analysis: Digital Fringe Pattern Measurement Techniques, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, UK, 1993).
    • (1993) Interfero-Gram Analysis: Digital Fringe Pattern Measurement Techniques
    • Creath, K.1
  • 7
    • 0001524242 scopus 로고
    • Phase-measuring interferometry: Beware these errors
    • R. J. Pryputniewicz, ed., Proc. SPIE
    • K. Creath, “Phase-measuring interferometry: beware these errors, ” in Laser Interferometry IV: Computer-Aided Interferometry, R. J. Pryputniewicz, ed., Proc. SPIE 1553, 213-219 (1991).
    • (1991) Laser Interferometry IV: Computer-Aided Interferometry , vol.1553 , pp. 213-219
    • Creath, K.1
  • 8
    • 84975597908 scopus 로고
    • Linear approximation for measurement errors in phase shifting interferometry
    • J. van Wingerden, H. J. Frankena, and C. Smorenburg, “Linear approximation for measurement errors in phase shifting interferometry, ” Appl. Opt. 30, 2718-2729 (1991).
    • (1991) Appl. Opt. , vol.30 , pp. 2718-2729
    • Van Wingerden, J.1    Frankena, H.J.2    Smorenburg, C.3
  • 9
    • 84975598554 scopus 로고
    • Electrooptic holography and its application to hologram interferometry
    • K. A. Stetson and W. R. Brohinsky, “Electrooptic holography and its application to hologram interferometry, ” Appl. Opt. 24, 3631-3637 (1985).
    • (1985) Appl. Opt. , vol.24 , pp. 3631-3637
    • Stetson, K.A.1    Brohinsky, W.R.2
  • 10
    • 0022948569 scopus 로고
    • Comparison of phase-measurement algorithms
    • K. Kreath, ed., Proc. SPIE
    • K. Creath, “Comparison of phase-measurement algorithms, ” in Surface Characterization and Testing, K. Kreath, ed., Proc. SPIE 680, 19-27 (1986).
    • (1986) Surface Characterization and Testing , vol.680 , pp. 19-27
    • Creath, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.