Microwave noise in III-V and SiGe based HBTs, comparison, trends, numbers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5470, Issue , 2004, Pages 151-163

  Sakalas, P ^a,b   Schroter M ^a   Zampardi, P ^c   Racanelli, M ^d  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^c SKYWORKS SOLUTIONS INC   (United States)

^d Jazz Semiconductor   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BICMOS TECHNOLOGY; COLLECTOR SHOT NOISES; CONDUCTION BANDS;

CMOS INTEGRATED CIRCUITS; CORRELATION METHODS; ELECTRIC CONDUCTANCE; HYDRODYNAMICS; MATHEMATICAL MODELS; MICROWAVES; SEMICONDUCTING SILICON COMPOUNDS; SHOT NOISE;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 4344658821     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.546899     Document Type: Conference Paper

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