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Volumn 22, Issue 4, 2004, Pages 1158-1165

Amorphous fluorocarbon polymer (a-C:F) films obtained by plasma enhanced chemical vapor deposition from perfluoro-octane (C 8F 18) vapor. II. Dielectric and insulating properties

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION BANDS; DIELECTRIC STRENGTH; FILM THICKNESS; MICROMETER RESOLUTION;

EID: 4344612141     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1759354     Document Type: Article
Times cited : (23)

References (59)
  • 18
    • 0242678178 scopus 로고    scopus 로고
    • edited by L. G. Christophorou (Kluwer Academic, New York)
    • Y. Sakai, in Gaseous Dielectrics, edited by L. G. Christophorou (Kluwer Academic, New York, 2001), Vol. IX, p. 285.
    • (2001) Gaseous Dielectrics , vol.9 , pp. 285
    • Sakai, Y.1
  • 25
    • 4344606806 scopus 로고    scopus 로고
    • Japanese Industrial Standard JIS C 2110; American Society of Testing Materials Standard ASTM D 149
    • Japanese Industrial Standard JIS C 2110; American Society of Testing Materials Standard ASTM D 149.
  • 26
    • 0002749034 scopus 로고    scopus 로고
    • Du Pont Nemour Corp., Product Catalog 〈http://www.dupont.com/teflon/ chemical〉
    • Product Catalog
  • 29
    • 0004261015 scopus 로고
    • Chapmann and Hall Ltd., London
    • J. C. Anderson, Dielectrics (Chapmann and Hall Ltd., London, 1964).
    • (1964) Dielectrics
    • Anderson, J.C.1
  • 37
  • 58
    • 0242509677 scopus 로고
    • edited by J. M. Meek and J. D. Craggs (Wiley, New York), Chap. 3
    • J. Dutton, in Electrical Breakdown of Gases, edited by J. M. Meek and J. D. Craggs (Wiley, New York, 1978), Chap. 3, p. 228.
    • (1978) Electrical Breakdown of Gases , pp. 228
    • Dutton, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.