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Volumn 3, Issue 8, 2004, Pages 545-550

A buckling-based metrology for measuring the elastic moduli of polymeric thin films

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING; ELASTIC MODULI; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; FOURIER TRANSFORMS; OPTICAL IMAGE STORAGE; PERMITTIVITY; PHASE SEPARATION; POISSON RATIO; POROSITY; THIN FILMS; VISCOELASTICITY; X RAYS;

EID: 4344569742     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1175     Document Type: Article
Times cited : (1260)

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