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Certain commercial equipment is identified in this article in order to specify adequately the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the items identified are necessarily the best available for the purpose.
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46
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Due to the nature of the polarization dependencies of the NEXAFS signal intensities one cannot distinguish between a completely disoriented sample and a sample whose chains are all tilted by ≈55°, the so called, "magic angle."
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51
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By carrying the NEXAFS experiments a θ = 55° we wanted to eliminate any possible influence of the orientation of the various functional groups at the Sylgard-184 surface on the PEY and FY NEXAFS intensities. Several data sets collected at various angles θ indeed confirmed that these surface functionalities were not oriented.
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35 revealed that the root-mean square roughness on Sylgard-184 ranged from 0.15 nm (as-prepared) to 0.3 nm (UVO90 treated for 30 mins).
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54
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As reported by Kim and coworkers (Ref. 42), these fillers are rarely detected within the first ≈5 nm below the film substrate despite their large concentration in Sylgard-184. In their study, the researchers stated that the above observation did not imply a macroscopic depletion of the filler in the surface region of PDMS. The filler particles could easily be coated by a polymer film of ≈5 nm in thickness and even uncoated and close-packed in the surface they would still constitute only less than 1% of the volume of the top ≈5-nm-thick layer for a flat geometry of special micrometer-sized particles with PDMS filling the interstices.
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