Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundaries

Journal of Microscopy

Volumn 215, Issue 2, 2004, Pages 191-202

  Walther, T ^a,b  

^a UNIVERSITY OF BONN   (Germany)

^b CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

Author keywords

Electron energy loss spectroscopy (EELS); Energy dispersive X ray spectroscopy (EDXS); Grain boundary segregation; Interfaces; Microanalysis; Planar defects; Solute segregation; Transmission electron microscopy (TEM)

Indexed keywords

DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PROBES; SEGREGATION (METALLOGRAPHY); SOLUBILITY; STACKING FAULTS;

ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELECTRON ENERGY-LOSS SPECTROSCOPY; ELECTRON-BEAM; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ENERGY-DISPERSIVE X-RAY SPECTROSCOPY; GRAIN BOUNDARY SEGREGATION; GRAIN-BOUNDARIES; PLANAR DEFECT; SOLUTE SEGREGATION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ACCURACY; ARTICLE; CALCULATION; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; GEOMETRY; PRIORITY JOURNAL; RELIABILITY; ROENTGEN SPECTROSCOPY; SIMULATION;

ANGUILLIFORMES;

EID: 4344564837     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01359.x     Document Type: Article

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