Scanning transmission electron microscopy analysis of grain boundaries in creep-resistant yttrium- and lanthanum-doped alumina microstructures

Journal of the American Ceramic Society

Volumn 82, Issue 10, 1999, Pages 2865-2870

  Bruley, John ^a,b   Cho, Junghyun ^b   Chan, Helen M ^b   Harmer, Martin P ^b   Rickman, Jeffrey M ^b  

^a IBM   (United States)

^b Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; EXPANSION; GRAIN BOUNDARIES; LANTHANUM; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM;

ELECTRON ENERGY-LOSS NEAR-EDGE STRUCTURES (ELNES);

ALUMINA;

EID: 0033204809     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb02169.x     Document Type: Article

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