STM characterization of the Si-P heterodimer

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 19, 2004, Pages

  Curson, N J ^a   Schofield, S R ^a   Simmons, M Y ^a   Oberbeck, L ^a   O'Brien, J L ^a,b   Clark, R G ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHORUS; SILICON;

ADSORPTION; ARTICLE; AUGER ELECTRON SPECTROSCOPY; CORRELATION ANALYSIS; INFRARED SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; TEMPERATURE DEPENDENCE;

EID: 42749105217     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.195303     Document Type: Article

References (23)

1. J.R. Tucker and T.C. Shen, Int. J. Circuit Theory Appl. 28, 553 (2000).
2. J.L. O'Brien, S.R. Schofield, M.Y. Simmons, R.G. Clark, A.S. Dzurak, N.J. Curson, B.E. Kane, N.S. McAlpine, M.E. Hawley, and G.W. Brown, Phys. Rev. B 64, 161401 (2001).
3. S.R. Schofield, N.J. Curson, M.Y. Simmons, F.J. Ruess, T. Hallam, L. Oberbeck, and R.G. Clark, Phys. Rev. Lett. 91, 136104 (2003).
4. B.E. Kane, Nature (London) 393, 133 (1998).
5. M.L. Yu and B.S. Meyerson, J. Vac. Sci. Technol. A 2, 446 (1984).
6. M.L. Colaianni, P.J. Chen, and J.T. Yates, Jr., J. Vac. Sci. Technol. A 12, 2995 (1994).
7. D.S. Yoo, M. Suemitsu, and N. Miyamoto, J. Appl. Phys. 78, 4988 (1995).
8. R.J. Hamers, Y. Wang, and J. Shan, Appl. Surf. Sci. 107, 25 (1996).
9. J. Shan, Y. Wang, and R.J. Hamers, J. Phys. Chem. 100, 4961 (1996).
10. D.-S. Lin, T.-S. Ku, and T.-J. Sheu, Surf. Sci. 424, 7 (1999).
11. D.-S. Lin, T.-S. Ku, and R.-P. Chen, Phys. Rev. B 61, 2799 (2000).
12. Y. Wang, X. Chen, and R.J. Hamers, Phys. Rev. B 50, 4534 (1994).
13. L. Oberbeck, N.J. Curson, M.Y. Simmons, R. Brenner, A. Hamilton, S.R. Schofield, and R.G. Clark, Appl. Phys. Lett. 81, 3197 (2002).
14. Y. Wang, M.J. Bronikowski, and R.J. Hamers, J. Phys. Chem. 98, 5966 (1994).
15. L. Kipp, R.D. Bringans, D.K. Biegelsen, J.E. Northrup, A. Garcia, and L.E. Swartz, Phys. Rev. B 52, 5843 (1995).
16. D.R. Bowler, J.H.G. Owen, C.M. Goringe, K. Miki, and G.A.D. Briggs, J. Phys.: Condens. Matter 12, 7655 (2000).
17. B.S. Swartzentruber, Surf. Sci. 386, 195 (1997).
18. B.S. Swartzentruber, J. Cryst. Growth 188, 1 (1998).
19. J. Da̧browski and HA. Müssig, Silicon Surfaces and Formation of Interfaces (World Scientific, Singapore, 2000).
20. L. Oberbeck, N.J. Curson, T. Hallam, M.Y. Simmons, R.G. Clark, and G. Bilger, cond-mat/0307495 (unpublished).
21. Y.W. Mo, J. Kleiner, M.B. Webb, and M.G. Lagally, Phys. Rev. Lett. 66, 1998 (1991).
22. P. Smith (private communication).
23. X.R. Qin and M.G. Lagally, Phys. Rev. B 59, 7293 (1999).