Sb lattice diffusion in Si1-xGex/Si(001) heterostructures: Chemical and stress effects

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 15, 2004, Pages

  Portavoce, A ^a,b   Gas, P ^b   Berbezier, I ^a   Ronda, A ^a   Christensen, J S ^c   Kuznetsov, A Yu ^c   Svensson, B G ^c  

^a CAMPUS DE LUMINY   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; GERMANIUM; SILICON;

ARTICLE; COMPRESSION; DIFFUSION COEFFICIENT; STRESS; STRUCTURE ANALYSIS; TEMPERATURE; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 42749099687     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.155415     Document Type: Article

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