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Volumn 75, Issue 7, 1999, Pages 941-943

Activation volume for antimony diffusion in silicon and implications for strained films

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EID: 0001606242     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124561     Document Type: Article
Times cited : (23)

References (25)
  • 10
    • 0010409450 scopus 로고    scopus 로고
    • edited by E. F. Schubert Cambridge University Press, Cambridge, UK
    • H.-J. Gossmann, in Delta Doping of Semiconductors, edited by E. F. Schubert (Cambridge University Press, Cambridge, UK, 1996), pp. 161 and 253.
    • (1996) Delta Doping of Semiconductors , pp. 161
    • Gossmann, H.-J.1
  • 14
    • 0002734525 scopus 로고
    • edited by F. F. Y. Wang North-Holland, Amsterdam
    • R. B. Fair, in Impurity Doping Process in Silicon, edited by F. F. Y. Wang (North-Holland, Amsterdam, 1981), p. 315.
    • (1981) Impurity Doping Process in Silicon , pp. 315
    • Fair, R.B.1
  • 17
    • 85034132619 scopus 로고    scopus 로고
    • note
    • This assumption could result in a small error that can be corrected when appropriate data become available. The contributions are known to have different activation energies (see Ref. 14).
  • 18
    • 85034143593 scopus 로고    scopus 로고
    • note
    • The uncertainty in D arises mainly from run-to-run temperature irreproducibility but also from run-to-run SIMS irreproducibility within a single sample and sample-to-sample SIMS irreproducibility. The combined uncertainty in D is estimated to be ±12% from the discrepancy between the two samples run at 2.5±0.1 GPa, under nominally identical conditions. The uncertainty in the slopes of the fitted lines are all ≤0.04 Ω.
  • 20
    • 0001705158 scopus 로고
    • The diffusivity of interstitials at 860°C used here is obtained by extrapolation using an estimated activation energy of 3.1 eV of data obtained at 810°C by Gossmann et al. in the studies of oxidation-enhanced diffusion in boron delta-doped samples. H.-J. Gossmann, G. H. Gilmer, C. S. Rafferty, F. C. Unterwald, T. Boone, J. M. Poate, H. S. Luftman, and W. Frank, J. Appl. Phys. 77, 1948 (1995); H.-J. Gossmann, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, T. Boone, and J. M. Poate, Appl. Phys. Lett. 63, 639 (1993).
    • (1995) J. Appl. Phys. , vol.77 , pp. 1948
    • Gossmann, H.-J.1    Gilmer, G.H.2    Rafferty, C.S.3    Unterwald, F.C.4    Boone, T.5    Poate, J.M.6    Luftman, H.S.7    Frank, W.8
  • 21
    • 0001062374 scopus 로고
    • The diffusivity of interstitials at 860°C used here is obtained by extrapolation using an estimated activation energy of 3.1 eV of data obtained at 810°C by Gossmann et al. in the studies of oxidation-enhanced diffusion in boron delta-doped samples. H.-J. Gossmann, G. H. Gilmer, C. S. Rafferty, F. C. Unterwald, T. Boone, J. M. Poate, H. S. Luftman, and W. Frank, J. Appl. Phys. 77, 1948 (1995); H.-J. Gossmann, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, T. Boone, and J. M. Poate, Appl. Phys. Lett. 63, 639 (1993).
    • (1993) Appl. Phys. Lett. , vol.63 , pp. 639
    • Gossmann, H.-J.1    Rafferty, C.S.2    Luftman, H.S.3    Unterwald, F.C.4    Boone, T.5    Poate, J.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.