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0001528106
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H.-J. Gossmann, T. E. Haynes, P. A. Stolk, D. C. Jacobson, G. H. Gilmer, J. M. Poate, H. S. Luftman, T. K. Mogi, and M. O. Thompson, Appl. Phys. Lett. 71, 3862 (1997).
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8
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edited by E. F. Schubert Cambridge University Press, Cambridge, UK
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H.-J. Gossmann, in Delta Doping of Semiconductors, edited by E. F. Schubert (Cambridge University Press, Cambridge, UK, 1996), pp. 161 and 253.
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edited by W. Kern Noyes, Park Ridge, NJ
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Handbook of Semiconductor Wafer Cleaning Technology: Science, Technology, and Applications, edited by W. Kern (Noyes, Park Ridge, NJ, 1993).
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Handbook of Semiconductor Wafer Cleaning Technology: Science, Technology, and Applications
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Y. C. Zhao, W. Barvosa-Carter, S. D. Theiss, S. Mitha, M. J. Aziz, and D. Schiferl, J. Appl. Phys. 84, 4049 (1998). The uncertainty in the present pressure determination is estimated to be ±0.4 GPa.
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Zhao, Y.C.1
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14
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0002734525
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edited by F. F. Y. Wang North-Holland, Amsterdam
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R. B. Fair, in Impurity Doping Process in Silicon, edited by F. F. Y. Wang (North-Holland, Amsterdam, 1981), p. 315.
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Fair, R.B.1
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15
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0001705158
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H.-J. Gossmann, G. H. Gilmer, C. S. Rafferty, F. C. Unterwald, T. Boone, J. M. Poate, H. S. Luftman, and W. Frank, J. Appl. Phys. 77, 1948 (1995).
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Boone, T.5
Poate, J.M.6
Luftman, H.S.7
Frank, W.8
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17
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85034132619
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note
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This assumption could result in a small error that can be corrected when appropriate data become available. The contributions are known to have different activation energies (see Ref. 14).
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18
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85034143593
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note
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The uncertainty in D arises mainly from run-to-run temperature irreproducibility but also from run-to-run SIMS irreproducibility within a single sample and sample-to-sample SIMS irreproducibility. The combined uncertainty in D is estimated to be ±12% from the discrepancy between the two samples run at 2.5±0.1 GPa, under nominally identical conditions. The uncertainty in the slopes of the fitted lines are all ≤0.04 Ω.
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19
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0041782286
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T. K. Mogi, M. O. Thompson, H.-J. Gossmann, J. M. Poate, and H. S. Luftman, Appl. Phys. Lett. 69, 1273 (1996).
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Mogi, T.K.1
Thompson, M.O.2
Gossmann, H.-J.3
Poate, J.M.4
Luftman, H.S.5
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20
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0001705158
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The diffusivity of interstitials at 860°C used here is obtained by extrapolation using an estimated activation energy of 3.1 eV of data obtained at 810°C by Gossmann et al. in the studies of oxidation-enhanced diffusion in boron delta-doped samples. H.-J. Gossmann, G. H. Gilmer, C. S. Rafferty, F. C. Unterwald, T. Boone, J. M. Poate, H. S. Luftman, and W. Frank, J. Appl. Phys. 77, 1948 (1995); H.-J. Gossmann, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, T. Boone, and J. M. Poate, Appl. Phys. Lett. 63, 639 (1993).
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J. Appl. Phys.
, vol.77
, pp. 1948
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Gossmann, H.-J.1
Gilmer, G.H.2
Rafferty, C.S.3
Unterwald, F.C.4
Boone, T.5
Poate, J.M.6
Luftman, H.S.7
Frank, W.8
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21
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0001062374
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The diffusivity of interstitials at 860°C used here is obtained by extrapolation using an estimated activation energy of 3.1 eV of data obtained at 810°C by Gossmann et al. in the studies of oxidation-enhanced diffusion in boron delta-doped samples. H.-J. Gossmann, G. H. Gilmer, C. S. Rafferty, F. C. Unterwald, T. Boone, J. M. Poate, H. S. Luftman, and W. Frank, J. Appl. Phys. 77, 1948 (1995); H.-J. Gossmann, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, T. Boone, and J. M. Poate, Appl. Phys. Lett. 63, 639 (1993).
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(1993)
Appl. Phys. Lett.
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, pp. 639
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Gossmann, H.-J.1
Rafferty, C.S.2
Luftman, H.S.3
Unterwald, F.C.4
Boone, T.5
Poate, J.M.6
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