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Volumn 254, Issue 15, 2008, Pages 4479-4482
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The reflectivity of Mo/Ag/Au ohmic contacts on p-type GaN for flip-chip light-emitting diode (FCLED) applications
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Author keywords
FCLED; GaN; Inter diffusion; Light reflectance; Ohmic contact; Reflectivity; SIMS
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Indexed keywords
FLIP CHIP DEVICES;
GALLIUM NITRIDE;
GOLD COMPOUNDS;
LIGHT EMITTING DIODES;
LIGHT REFLECTION;
FLIP-CHIP LIGHT-EMITTING DIODE (FCLED);
INTER-DIFFUSION;
UN-ANNEALED CONTACT;
OHMIC CONTACTS;
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EID: 42749083723
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.01.039 Document Type: Article |
Times cited : (8)
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References (16)
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