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Volumn 254, Issue 15, 2008, Pages 4479-4482

The reflectivity of Mo/Ag/Au ohmic contacts on p-type GaN for flip-chip light-emitting diode (FCLED) applications

Author keywords

FCLED; GaN; Inter diffusion; Light reflectance; Ohmic contact; Reflectivity; SIMS

Indexed keywords

FLIP CHIP DEVICES; GALLIUM NITRIDE; GOLD COMPOUNDS; LIGHT EMITTING DIODES; LIGHT REFLECTION;

EID: 42749083723     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.01.039     Document Type: Article
Times cited : (8)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.