Growth and stability of Ga2O3 nanospheres

Thin Solid Films

Volumn 516, Issue 15, 2008, Pages 4742-4749

  Penner, Simon ^a   Klötzer, Bernhard ^a   Jenewein, Bernd ^a   Klauser, Frederik ^a   Liu, Xianjie ^a   Bertel, Erminald ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

Atomic Force Microscopy; Crystallization; Electron microscopy; Gallium oxide; Oxidation; Reduction; Selected Area Electron Diffraction; X ray Photoelectron Spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; FILM GROWTH; GALLIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

GALLIUM OXIDE THIN FILMS; OXYGEN PRESSURES; SELECTED AREA ELECTRON DIFFRACTION;

NANOSPHERES;

EID: 42649123031     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.08.094     Document Type: Article

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