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Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2?

(3) Foster, A S a Rohl, A L b Shluger, A L a

a UNIVERSITY COLLEGE LONDON (United Kingdom)

b CURTIN UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243836394 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100635 Document Type: Article

Times cited : (7)

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