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Volumn 90, Issue 4, 2003, Pages 461021-461024

Atomistics of Ge deposition on Si(100) by atomic layer epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; DEPOSITION; EPITAXIAL GROWTH; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SILICON; SUBSTRATES;

EID: 4243437587     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (40)

References (19)
  • 1
    • 0031170519 scopus 로고    scopus 로고
    • and references therein
    • F. Liu, F. Wu, and M. G. Lagally, Chem. Rev. 97, 1045 (1997), and references therein.
    • (1997) Chem. Rev. , vol.97 , pp. 1045
    • Liu, F.1    Wu, F.2    Lagally, M.G.3
  • 5
    • 0033076887 scopus 로고    scopus 로고
    • and references therein
    • See, for example, D. J. Paul, Adv. Mater. 11, 191 (1999), and references therein.
    • (1999) Adv. Mater. , vol.11 , pp. 191
    • Paul, D.J.1
  • 7
    • 0036284751 scopus 로고    scopus 로고
    • and references therein
    • C. Teichert, Phys. Rep. 365, 335 (2002), and references therein.
    • (2002) Phys. Rep. , vol.365 , pp. 335
    • Teichert, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.