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Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

A noncontact atomic force microscope in air using a quartz resonator and the FM detection method

(5) Nishi, R a Houda, I a Kitano, K a Sugawara, Y a Morita, S a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243325507 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100638 Document Type: Article

Times cited : (6)

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