Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 332-336

  Nishi, Ryuji ^a   Houda, Isao ^a   Aramata, Tomohide ^a   Sugawara, Yasuhiro ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PHASE TRANSITIONS; QUARTZ; SENSORS;

NEEDLE SENSORS; NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

CRYSTAL RESONATORS;

EID: 0033732920     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00547-4     Document Type: Article

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