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Volumn 35, Issue 3-6, 2004, Pages 253-268

Scanning near-field thermal and thermoacoustic microscopy: Performances and limitations

Author keywords

AFM; Local probe; Near field thermal microscopy; SNOM; Thermoacoustical imaging

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; DATA REDUCTION; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; RADIOMETRY; SCANNING ELECTRON MICROSCOPY; SENSORS;

EID: 4243064964     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2003.10.003     Document Type: Conference Paper
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.