Super-resolution in photothermal and thermoelastic microscopy: Extension of the notion of near field;Super-résolution en microscopie photothermique et thermoélastique: Extension du concept de champ proche

Revue Generale de Thermique

Volumn 37, Issue 7, 1998, Pages 556-564

  Cretin, Bernard ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

Images; Laser; Near field; Non destructive evaluation; Optical probe; Photothermal microscopy; Resolution criterion; Scanning; Super resolution; Thermoelastic microscopy

Indexed keywords

EID: 4243160342     PISSN: 00353159     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0035-3159(98)80034-2     Document Type: Article

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