Thermoelastic modeling: Application to super-resolution in photothermal and thermoelastic microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3098, Issue , 1997, Pages 466-475

  Cretin, Bernard ^a   Daher, N ^a   Cavallier, Bruno ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

imaging; laser probe; near field; non destructive evaluation; Photothermal microscopy; resolution; thermoelastic

Indexed keywords

IMAGING; LASER PROBE; NEAR-FIELD; NON DESTRUCTIVE EVALUATION; PHOTOTHERMAL MICROSCOPY; RESOLUTION; THERMOELASTICS;

OPTICAL RESOLVING POWER; OPTICAL TESTING; PHOTOEXCITATION; PROBES;

THERMOELASTICITY;

EID: 0003988081     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.281193     Document Type: Conference Paper

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