Thermovoltage in scanning tunneling microscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 109, Issue 1, 2000, Pages 117-125

  Hoffmann, D ^b   Seifritz, J ^a   Weyers, B ^a   Moller R ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SEMICONDUCTING SILICON; SURFACE PHENOMENA; THERMOELECTRICITY;

SCANNING TUNNELING POTENTIOMETRY; THERMOVOLTAGE;

SCANNING TUNNELING MICROSCOPY;

EID: 0034247797     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00111-0     Document Type: Article

References (13)

1. Williams C.C., Wickramasinghe H.K. Nature. 344:1990;317.
2. Kohler M. Ann. Physik. 38:1940;542.
3. Leavens C.R., Aers G.C. Solid State Comm. 61:(5):1987;289.
4. Støvneng J.A., Lipavský P. Phys. Rev. B42:1990;9214.
5. Tersoff J., Hamann D.R. Phys. Rev. B31:(2):1985;805.
6. Bardeen J. Phys. Rev. Lett. 6:1961;57.
7. Muralt P., Pohl D.W. Appl. Phys. Lett. 48:1986;514.
8. Wolf J.F., Ibach H. Appl. Phys. A52:1991;218.
9. Crommie M.F., Lutz C.P., Eigler D.M. Nature. 524:1993;363.
10. Hasegawa Y., Avouris Ph. Phys. Rev. Lett. 71:1993;1071.
11. Jepsen O., Glotzel D., Mackintosh A.R. Phys. Rev. B23:1981;2684.
12. Kevan S.D., Gaylord R.H. Phys. Rev. B36:1987;5809.
13. Hamers R.J., Tromp R.M., Demuth J.E. Phys. Rev. Lett. 56:1986;1972.