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Volumn 72, Issue 7, 2001, Pages
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Calibration of a Scanning Joule Expansion Microscope (SJEM)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0009094307
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390100648 Document Type: Article |
Times cited : (13)
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References (15)
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