Thermal imaging by infrared near-field microscopy

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 1, Issue , 1996, Pages 249-250

  Feng, C ^a   Unlu, M S ^a   Goldberg, B B ^a   Herzog, W D ^a  

^a BOSTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED RADIATION; INTEGRATED CIRCUIT TESTING; OPTICAL DESIGN; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PIEZOELECTRIC TRANSDUCERS; PROBES; SCANNING; SIGNAL DETECTION; THERMAL EFFECTS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY (NSOM); NONCONTACT THERMAL IMAGING; TEMPERATURE CALIBRATION;

THERMOGRAPHY (IMAGING);

EID: 0030409156     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)